Optimization of the reliability level in complex microelectronic devices

  • B. P. Kredentser National Aviation University, Kyiv, Ukraine
  • S. V. Lenkov National Aviation University, Kyiv, Ukraine
  • R. A. Salimov National Aviation University, Kyiv, Ukraine
  • S. A. Shomin National Aviation University, Kyiv, Ukraine
  • D. A. Perehudov National Aviation University, Kyiv, Ukraine
Keywords: microelectronic devices, reliability optimization, subsystem reliability, element modernization, redundancy, fault-free operation

Abstract

The problem of optimizing the reliability indicator of subsystems in complex microelectronic devices is considered, taking into account both the modernization of elements and their redundancy simultaneously. Calculation relations are obtained, allowing to determine up to what level it is expedient to increase the probability of fault-free operation of a single element (the elements are identical) and starting from what level they should be redundantly duplicated to obtain the maximum value of the reliability indicator of the redundant subsystem.
Published
2002-06-30
How to Cite
Kredentser, B. P., Lenkov, S. V., Salimov, R. A., Shomin, S. A., & Perehudov, D. A. (2002). Optimization of the reliability level in complex microelectronic devices. Technology and Design in Electronic Equipment, (3), 62-64. Retrieved from https://tkea.com.ua/index.php/journal/article/view/TKEA2002.3.62
Issue
No. 3 (2002): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2002 Kredentser B. P., Lenkov S. V., Salimov R. A., Perehudov D. A., Shomin S. A.

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.