Increase of noise immunity of photomask images binarization in the space of the wavelet transform

  • G. Yu. Shcherbakova Odessa National Polytechnic University, Odessa, Ukraine
  • A. A. Dilevsky Odessa National Polytechnic University, Odessa, Ukraine
  • V. N. Krylov Odessa National Polytechnic University, Odessa, Ukraine
  • O. V. Logvinov Odessa National Polytechnic University, Odessa, Ukraine
  • O. E. Plachinda Odessa National Polytechnic University, Odessa, Ukraine
Keywords: binarization, wavelet-transform, subgradient, noise immunity

Abstract

An information technology for histogram analysis and a method for noise immunity binary processing of integrated and printed circuits board photo-masks image based on this technology was carryed out. This method based on the sub-gradient iterative noise stability optimization method satisfies the demands of the automated optical control of photo-masks and printed circuits in the error and noise immunity. The maximum binary processing error does not exceed 1 pixel if the signal-to-noise ratio is more than 7.

Published
2011-12-29
How to Cite
Shcherbakova, G. Y., Dilevsky, A. A., Krylov, V. N., Logvinov, O. V., & Plachinda, O. E. (2011). Increase of noise immunity of photomask images binarization in the space of the wavelet transform. Technology and Design in Electronic Equipment, (6), 23-26. Retrieved from https://tkea.com.ua/index.php/journal/article/view/TKEA2011.6.23
Issue
No. 6 (2011): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2011 Shcherbakova G. Yu., Dilevsky A. A., Krylov V. N., Logvinov O. V., Plachinda O. E.

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.