Method of determination of temperature and heat resistance of the points on the integrated circuit crystal surface

  • V. M. Popov Institute of Microdevices of NAS of Ukraine, Kyiv, Ukraine
  • A. S. Klimenko Institute of Microdevices of NAS of Ukraine, Kyiv, Ukraine
  • A. P. Pokanevich Institute of Microdevices of NAS of Ukraine, Kyiv, Ukraine
  • V. L. Samotovka Institute of Microdevices of NAS of Ukraine, Kyiv, Ukraine
Keywords: integrated circuit, heat resistance, liquid crystal, phase state

Abstract

Method for visualization of integrated circuit (IC) surface temperature by means of the liquid crystal film deposited from solution on its surface is proposed. The boundaries of local regions represent isotherms with corresponding phase transitions. On the base of isotherms positions and consumed by IC power thermal resistances between crystal and environment are determined.

Published
2011-12-29
How to Cite
Popov, V. M., Klimenko, A. S., Pokanevich, A. P., & Samotovka, V. L. (2011). Method of determination of temperature and heat resistance of the points on the integrated circuit crystal surface. Technology and Design in Electronic Equipment, (6), 30-34. Retrieved from https://tkea.com.ua/index.php/journal/article/view/TKEA2011.6.30
Issue
No. 6 (2011): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2011 Popov V. M., Klimenko A. S., Pokanevich A. P., Samotovka V. L.

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This work is licensed under a Creative Commons Attribution 4.0 International License.