Gorev, N. B., I. F. Kodzhespirova, and E. N. Privalov. 2010. “Deep Trap Diagnostics at the Film — Substrate Interface in GaAs Thin-Film Epitaxial Structures”. Technology and Design in Electronic Equipment, no. 4 (August), 53-56. https://tkea.com.ua/index.php/journal/article/view/TKEA2010.4.53.