Gorev, N. B., I. F. Kodzhespirova, and E. N. Privalov. “Deep Trap Diagnostics at the Film — Substrate Interface in GaAs Thin-Film Epitaxial Structures”. Technology and Design in Electronic Equipment, no. 4, Aug. 2010, pp. 53-56, https://tkea.com.ua/index.php/journal/article/view/TKEA2010.4.53.