Pseudo-ring tests resolution for dynamic single faults in word-oriented memory

S. S. Gritcov; G. F. Sorokin; T. V. Shestacova

doi:10.15222/TKEA2018.5-6.03

S. S. Gritcov Technical University of Moldova, Chisinau, Moldova
G. F. Sorokin Technical University of Moldova, Chisinau, Moldova
T. V. Shestacova Technical University of Moldova, Chisinau, Moldova

DOI: https://doi.org/10.15222/TKEA2018.5-6.03

Keywords: dynamic single faults, pseudo-ring testing, iteration

Abstract

This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution determination results for pseudo-ring tests in relation to these faults in the word-oriented memory. Also, a comparative analysis of the pseudo-ring tests with known March tests is done. The results show that pseudo-ring tests with an algorithmic complexity of (30-60)N, where N is the number of all memory cells, can cover from 75 to 100% of all single dynamic faults. This advantage allows using pseudo-ring tests as an alternative to existing classical and March tests.

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