No. 5–6 (2018): Technology and design in electronic equipment

Articles

• Pseudo-ring tests resolution for dynamic single faults in word-oriented memory

  S. S. Gritcov, G. F. Sorokin, T. V. Shestacova

  3-9

  • PDF
• X-ray radiation during pulsed laser treatment of opal matrices

  A. F. Belyanin, V. V. Borisov, V. V. Popov

  10-16

  • PDF
• Study of the corrective ability of sync codes for the matched processing decoder

  A. V. Sadchenko, O. A. Kushnirenko, A. G. Yurkevych, V. S. Sevastianov

  17-23

  • PDF (Українська)
• The influence of detector's parameters on the efficiency of radio signals with complex phase modulation receiving

  I. P. Maksymiv, S. І. Altunin, A. P. Bondariev, I. V. Horbatyi

  24-29

  • PDF (Українська)
• CFD-simulation of impact jet radiator for thermal testing of microprocessors

  V. E. Trofimov, A. L. Pavlov, A. S. Storozhuk

  30-36

  • PDF (Українська)
• Study on Cu2ZnSnSe4 crystals and heterojunctions on their basis

  T. T. Kovaliuk, E. V. Maistruk, M. N. Solovan, I. P. Koziarskyi, P. D. Maryanchuk

  37-43

  • PDF (Українська)
• Investigation of band gap width in mixed ZnSxSe1–x crystals

  O. G. Trubaieva, M. A. Chaika

  44-49

  • PDF (Українська)
• Influence of temperature on optical properties of thin films Cu2ZnSnSe4

  E. V. Maystruk, I. P. Koziarskyi, D. P. Koziarskyi, P. D. Maryanchuk

  50-54

  • PDF (Українська)