Modeling of useful operating life of radioelectronics
Abstract
The author considers the possibility of using the laws of nonequilibrium thermodynamics to determine the relationship between controlled parameters of radioelectronics and the displayed environment, as well as the construction of a deterministic model of the processes of manufacturing defects development. This possibility is based on the observed patterns of change in the amount of content area, in accordance with the principles of behaviour of the thermodynamic parameters characterizing the state of the real environment (entropy, the quantity of heat, etc.). The equation for the evolution of the technical state of radioelectronics is based on the deterministic kinetic model of the processes occurring in the multi-component environment, and on the observation model, which takes into account the errors caused by external influences instability and uncertainty.
References
Davydov P.S. Tekhnicheskaya diagnostika radioelektronnykh ustroistv i sistem. [Technical diagnostics of electronic devices and systems]. Moscow, Radio and communication, 1991, 256 p. (Rus)
Strel`nikov V.P., Fedukhin A.V. Otsenka i prognozirovanie nadezhnosti elektronnykh elementov sistem [Evaluation and prediction of reliability of electronic systems elements]. Kiev, Logos, 2002, 486 p. (Rus)
Andrusevich A. A., Nevlyudov I. Sh., Rozdolovskii Yu. M., Vtorov E. P., Sotneyk S. V. [Estimating properties of the materials forming wirings of electronic equipment]. Tekhnologiya priborostroeniya. 2005, no 2, pp. 51–59. (Rus)
Andrusevich A. A., Nevlyudov I. Sh., Omarov M. A., Vtorov E. P. [Thermodynamics methods in modeling the process of spending life electronic equipment]. Tekhnologiya priborostroeniya. 2007, no 2, pp. 10–12. (Rus)
Andrusevich A. A., Nevlyudov I. Sh. [How the system will monitor the resource consumption of electronic equipment]. Radioelektronni i komp’yuterni sistemi. 2012, no 1, pp. 7–10. (Rus)
Chaplygin D. Yu., Abramov P. B., Tsvetkov V. V. [Simulation model of the dynamics of failure and disaster recovery of complex electronic systems]. Matematicheskoe modelirovanie sistem obrabotki informatsii i upravleniya: Sbornik nauchnykh trudov. Voronezh. in-t MVD Rossii. 2001, pp. 14–19. (Rus)
Chernyaev V.N. Fiziko-khimicheskie protsessy v tekhnologii REA [Physico-chemical processes in the technology of electronic equipment]. Moscow, Higher School, 1987, 376 p. (Rus)
Nevlyudov I.Sh., Rozdolovskii Yu.M., Andrusevich A.A. [Heterogene model of development production of defects]. Nauch.-tekhn. zhurnal. Aviatsionno-kosmicheskaya tekhnika i tekhnologiya. Khar`kov: «KHAI». 2003, no 38, pp. 114-119. (Rus)
Nevlyudov I.Sh., Vtorov E.P., Rozdolovskii Yu.M. [Kinetic models of development defects arising in the manufacture of electronic equipment]. Nauch.-tekhn. zhurnal. Aviatsionno-kosmicheskaya tekhnika i tekhnologiya. Khar`kov: «KHAI». 2003, no 39, pp. 76-81. (Rus)
Sotskov B.S. Osnovy teorii i rascheta nadezhnosti elementov i ustroistv avtomatiki i vychisli-tel`noi tekhniki. [Fundamentals of the theory and calculation of reliability of the components and devices of automation and computing]. Moscow, Visshaya shkola, 1970, 270 p. (Rus)
Ogarkov M.A. Metody statisticheskogo otsenivaniya parametrov sluchainykh protsessov [Statistical methods for estimating the parameters of stochastic processes]. Moscow, Energoatomizdat, 1990, 208 p. (Rus)
Nevlyudov I. Sh., Rosdolovsky Y. M. [Mapping processes of manifestations technological heredity electronic equipment]. Nauch.-tekhn. sb. «Radiotekhnika». Khar`kov, KHNURE, 2003, no 133, pp. 218-221. (Rus)
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