Dimensional and geometric parameters of microstructure models for thick resistive films

Abstract

The similarities and differences in the dimensional and geometric parameters of microstructure models for silver-palladium thick-film resistors (TFRs) are analyzed. For the first time, using the structural model of metallic clusters and the cluster model of electrical connections based on experimental data, the number of Gaussian normal distribution samples for the length and area of conductive granules and the intergranular distance is estimated over a wide range of thick-film resistor resistivities. The results of the work are applied in the study of current flow processes in TFRs.