Instrumental and technological modeling of autoemission silicon microcathodes

  • А. A. Druzhynin Lviv Polytechnic National University, Ukraine
  • V. I. Holota Lviv Polytechnic National University, Ukraine
  • I. T. Kogut Vasyl Stefanyk Precarpathian National University, Ivano-Frankivsk, Ukraine
  • S. V. Sapon Lviv Polytechnic National University, Ukraine
  • Yu. M. Khoverko Lviv Polytechnic National University, Ukraine
Keywords: digital lithography, autoemission microcathode, stable autoemission, local structures, silicon-on-insulator, electrical circuit

Abstract

A structure of a system for converting topological information for digital lithography is proposed. A method for forming local three-dimensional SOI (Silicon-on-Insulator) structures has been developed, which makes it possible to create both planar and three-dimensional device elements and contacts. On the SOI structures, a control high-voltage MOS transistor and a memory cell with a signal shaper for storing topological information have been designed. Expert optimization of the memory cell topology has made it possible to significantly reduce its area compared to that of a cell fabricated using standard n-channel MOS technology.

Published
2008-10-30
How to Cite
DruzhyninА. A., Holota, V. I., Kogut, I. T., Sapon, S. V., & Khoverko, Y. M. (2008). Instrumental and technological modeling of autoemission silicon microcathodes. Technology and Design in Electronic Equipment, (5), 43-49. Retrieved from https://tkea.com.ua/index.php/journal/article/view/TKEA2008.5.43