No. 2 (2002): Tekhnologiya i konstruirovanie v elektronnoi apparature

Articles

• Statistical estimation of manufacturing labor costs for printed circuit boards of radio-electronic equipment

  A. A. Yefimenko, A. V. Golubev, A. S. Kondrashov

  3-5

  • PDF (Українська)
• Generators with electromechanical converters based on negatron analogs

  O. N. Nehodenko, V. A. Voronin, D. V. Zaruba

  5-8

  • PDF (Українська)
• Design methodology and characteristics of a class E autogenerator

  V. H. Kryzhanovskyi, A. N. Rudiakova, D. V. Chernov

  9-12

  • PDF (Українська)
• Calculation of elastic mechanical stresses in inhomogeneous semiconductor structures

  F. D. Kasimov, A. E. Liutfalibekova

  13-14

  • PDF (Українська)
• Features of the development of digital fiber-optic modules

  A. A. Merzhvinskyi, V. I. Osinskyi, A. V. Palahin, V. H. Verbytskyi, A. A. Voronko, P. A. Merzhvinskyi, P. V. Belash, Yu. I. Sybryn, S. P. Ostapchuk

  15-21

  • PDF (Українська)
• Acousto-optic data flow control in optical storage devices with bit-by-bit representation of information

  V. V. Danilov

  22-28

  • PDF (Українська)
• Correlation passive acoustic localization

  V. A. Tarasov, D. A. Kropachev

  29-34

  • PDF (Українська)
• Investigation of methods for constructing computing devices based on FPGA

  V. I. Zhabin, N. A. Kovalev

  35-39

  • PDF (Українська)
• Multi-chip modules on an anodized aluminum substrate

  V. A. Sokol, A. I. Vorobyova

  40-45

  • PDF (Українська)
• Information-measuring system for opto-capacitive spectroscopy of semiconductors

  V. A. Vasilyev

  46-49

  • PDF (Українська)
• Manufacturing technology of laser dyes for the 472–600 nm range

  V. P. Kruhlenko, I. Ye. Maronchuk, M. V. Povstianoi

  50-54

  • PDF (Українська)
• One of the degradation mechanisms of microelectromechanical structures of pressure sensors

  S. A. Adarchyn, A. S. Kuzhnenkov, L. V. Kozhitov, V. G. Kosushkin

  55-57

  • PDF (Українська)
• Features of the development of SAW-based pressure sensors for NPPs

  Ya. I. Lepykh, V. K. Lopushenko, N. H. Cherniak, Yu. Ye. Nikolaienko

  58-62

  • PDF (Українська)
• Dimensional and geometric parameters of microstructure models for thick resistive films

  A. V. Sterkhova

  63-64

  • PDF (Українська)