No. 5 (2012): Tekhnologiya i konstruirovanie v elektronnoi apparature

Articles

• Multilayer circuits with thick-film polymer insulation

  V. G. Spirin

  3-7

  • PDF (Українська)
• LED electric-measuring indicators for multithreshold comparators

  G. A. Oborskii, V. I. Koval’kov, V. N. Tikhenko, P. T. Slobodyanik

  8-13

  • PDF (Українська)
• Thermal mathematical model of semiconductor devices for measurement of current-voltage characteristics by pulse method

  Ye. O. Yermolenko, O. F. Bondarenko, O. M. Baranov

  14-18

  • PDF (Українська)
• Si1–xGex nanocrystals as sensitive elements for magnetic field and temperature sensors

  А. A. Druzhinin, І. P. Ostrovskii, Yu. М. Khoverko, S. І. Nichkalo, R. М. Koretskii

  19-21

  • PDF (Українська)
• Improving the reliability of Schottky diodes under the influence of electrostatic discharges

  V. A. Sоlоdukha, A. S. Turtsevich, J. A. Solov’yov, I. I. Rubtsevich, A. F. Kerentsev

  22-26

  • PDF (Українська)
• Photoelectric properties of n-SiC/n-Si heterojunctions

  A. V. Semenov, А. А. Kozlovskii, V. M. Puzikov

  27-30

  • PDF (Українська)
• Photodiode based on GaP sensitized to short-wave region of UV spectrum

  Yu. G. Dobrovol’skii

  31-34

  • PDF (Українська)
• Influence of base impurity distribution on the photoelectric properties of surface-barrier UV photodetectors

  Yu. N. Bobrenko, V. N. Komaschenko, N. V. Yaroshenko, G. I. Sheremetova, B. S. Atdaev

  35-38

  • PDF (Українська)
• Technology for boron-doped layers formation on the diamond

  K. N. Zyablyuk, A. Yu. Mityagin, N. H. Talipov, G. V. Chucheva, M. P. Duhnovskii, R. A. Khmel’nitskii

  39-43

  • PDF (Українська)
• The investigation of quality of power-transistor crystals soldering by a transient impedance-spectrometer

  A. S. Turtsevich, I. I. Rubtsevich, Ya. А. Solov’yov, O. S. Vas’kov, V. K. Kononenko, V. S. Niss, A. F. Kerentsev

  44-47

  • PDF (Українська)
• Mass transfer in liquid-phase epitaxy of two-layer systems

  S. M. Dranchuk, V. A. Zavadzkii, V. A. Mokritskii

  48-51

  • PDF (Українська)